Configuration

6”Wafer ==> Electric Test ==> Sorting

Dimensions

LxWxH：1200mm x 700mm x 1500mm

Applicable Packages

Die 30~220mil

Wafer Table Input &    Pickup Tolerances

6 Inch (DTF 2-6-1 Metal Frames)

θ: +/- 3°

Electric Test System

1 Test Station (4 Contacts, 2 on top & bottom)

Sorting Boxes

1~7 Boxes (Bin 1 ~ Bin 7)

CCD Systems

Wafer Table Pickup CCD (5MP)

Run Speed

≧15k/hr. (Variable Package Size)